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L. Li, X. D. Ma, Y. T. Dai, H. Zhang, G. Nichols, L. Cheng, D. Langenberg, G. X. Miao, Conductance spectroscopy of vertical topological Josephson junction Nb/(Bi0.5Sb0.5)2Te3/Nb
发布时间：2026-04-28 点击次数：
发表刊物：SPIE Nanoscience + Engineering
卷号：San Diego,
页面范围：California, United States, (2018)
是否译文：否
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