Y. C. Liu, C. M. Wang, W. Y. Huang, S. T. Wang, H. L. Qiu, W. F. Ge, M. X. Chen, H. Zhang*, Y. L. Gu, X. M. Zhang, X. L. Li, X. Y. Gao, Y. J. Yang*, Unraveling structural phase transformation by simultaneously determining the lattice constants and mismatch angle in VO2/Al2O3 epitaxial thin films